歡迎訪問中科光析科學(xué)技術(shù)研究所官網(wǎng)!
免費(fèi)咨詢熱線
400-635-0567
雙極型晶體管檢測(cè)項(xiàng)目報(bào)價(jià)???解決方案???檢測(cè)周期???樣品要求? |
點(diǎn) 擊 解 答??![]() |
本標(biāo)準(zhǔn)規(guī)定了工作頻率在10到40kHz范圍的快速型絕緣柵雙極型晶體管的型號(hào)、外形尺寸、額定值、特性、試驗(yàn)方法和檢驗(yàn)規(guī)則等
Insulated gate bipolar transistor
Measuring methods for insulated-gate bipolar transistor
開關(guān)用雙極型晶體管空白詳細(xì)規(guī)范
Blank detail specification for bipolar transistors for switching applications
Настоящий стандарт распространяется на биполярные транзисторы малой мощности и устанавливает метод измерения входного сопротивления h11
Transistors bipolar. Input resistance measurement technique
Настоящий стандарт распространяется на биполярные транзисторы и устанавливает методы измерения временных параметров: времени задержки t
Bipolar transistors. Methods of time parameters measurement
Semiconductor devices.part 7: bipolar transistors
本標(biāo)準(zhǔn)適用于SJ/T 10438《雙極型晶體管直流參數(shù)測(cè)試儀通用技術(shù)條件》所規(guī)定的性能特性的測(cè)試
Test methods for bipolar transister DC parameter testers
本標(biāo)準(zhǔn)規(guī)定了工作頻率在10到40kHz范圍的快速型絕緣柵雙極型晶體管的臂和臂對(duì)模塊的型號(hào)、外形尺寸、額定值和特性、試驗(yàn)方法和檢驗(yàn)規(guī)則等
Insulated gate bipolar transistor modules arm and pair of arms
本空白詳細(xì)規(guī)范規(guī)定了制定高頻放大管殼額定雙極型晶體管詳細(xì)規(guī)范的基本原則,制定該范圍內(nèi)的所有詳細(xì)規(guī)范應(yīng)與本空白詳細(xì)規(guī)范一致。 本空白詳細(xì)規(guī)范是與GB/T4589.1-1989《半導(dǎo)體器件 分立器件和集成電路總規(guī)范》和GB/T 12560-1990《半導(dǎo)體器件 分立器件分規(guī)范
Semiconductor devices--Discrete devices. Part 7: Bipolar transistors. Section Four--Blank detail specification for case-rated bipolar transistors for high-frequency amplification
本文件規(guī)定了絕緣柵雙極型晶體管(簡(jiǎn)稱 IGBT)用有機(jī)硅凝膠的技術(shù)要求、試驗(yàn)方法、檢驗(yàn)規(guī)則、標(biāo)志、包裝、運(yùn)輸和貯存。 本文件適用于各種IGBT模塊用的雙組分加成型有機(jī)硅凝膠
Silicone Gels for Insulated Gate Bipolar Transistors
Bipolar transistors. Method for measuring combination frequencies
本空白詳細(xì)規(guī)范規(guī)定了制定高低頻放大環(huán)境額定的雙極型晶體管詳細(xì)規(guī)范的基本原則,制定該范圍內(nèi)的所有詳細(xì)規(guī)范應(yīng)與本空白詳細(xì)規(guī)范一致
Semiconductor devices--Discrete devices. Part 7: Bipolar transistors. Section One--Blank detail specification for ambient-rated bipolar transistors for low and high frequency amplification
本標(biāo)準(zhǔn)適用于采用直流法、單脈沖法測(cè)試雙極型晶體管直流參數(shù)的各類多參數(shù)測(cè)試儀,也適用于各類單參數(shù)的直流參數(shù)測(cè)試儀。它是直流參數(shù)測(cè)試儀產(chǎn)品設(shè)計(jì)、、生產(chǎn)和使用的共同技術(shù)依據(jù),也是制訂各種直流參數(shù)測(cè)試儀產(chǎn)品標(biāo)準(zhǔn)的共同技術(shù)依據(jù)
General specification for bipolar transister DC parameter testers
Transistors bipolar. Methods for measuring noise figure at low frequencies
Terminology and letter symbols for insulated-gate bipolar transistor
本標(biāo)準(zhǔn)規(guī)定了工作頻率在10到40kHz范圍的快速型絕緣柵雙極型晶體管的型號(hào)、外形尺寸、額定值、特性、試驗(yàn)方法和檢驗(yàn)規(guī)則等
Insulated gate bipolar transistor
Measuring methods for insulated-gate bipolar transistor
開關(guān)用雙極型晶體管空白詳細(xì)規(guī)范
Blank detail specification for bipolar transistors for switching applications
Настоящий стандарт распространяется на биполярные транзисторы малой мощности и устанавливает метод измерения входного сопротивления h11
Transistors bipolar. Input resistance measurement technique
Настоящий стандарт распространяется на биполярные транзисторы и устанавливает методы измерения временных параметров: времени задержки t
Bipolar transistors. Methods of time parameters measurement
Semiconductor devices.part 7: bipolar transistors
本標(biāo)準(zhǔn)適用于SJ/T 10438《雙極型晶體管直流參數(shù)測(cè)試儀通用技術(shù)條件》所規(guī)定的性能特性的測(cè)試
Test methods for bipolar transister DC parameter testers
本標(biāo)準(zhǔn)規(guī)定了工作頻率在10到40kHz范圍的快速型絕緣柵雙極型晶體管的臂和臂對(duì)模塊的型號(hào)、外形尺寸、額定值和特性、試驗(yàn)方法和檢驗(yàn)規(guī)則等
Insulated gate bipolar transistor modules arm and pair of arms
本空白詳細(xì)規(guī)范規(guī)定了制定高頻放大管殼額定雙極型晶體管詳細(xì)規(guī)范的基本原則,制定該范圍內(nèi)的所有詳細(xì)規(guī)范應(yīng)與本空白詳細(xì)規(guī)范一致。 本空白詳細(xì)規(guī)范是與GB/T4589.1-1989《半導(dǎo)體器件 分立器件和集成電路總規(guī)范》和GB/T 12560-1990《半導(dǎo)體器件 分立器件分規(guī)范
Semiconductor devices--Discrete devices. Part 7: Bipolar transistors. Section Four--Blank detail specification for case-rated bipolar transistors for high-frequency amplification
本文件規(guī)定了絕緣柵雙極型晶體管(簡(jiǎn)稱 IGBT)用有機(jī)硅凝膠的技術(shù)要求、試驗(yàn)方法、檢驗(yàn)規(guī)則、標(biāo)志、包裝、運(yùn)輸和貯存。 本文件適用于各種IGBT模塊用的雙組分加成型有機(jī)硅凝膠
Silicone Gels for Insulated Gate Bipolar Transistors
Bipolar transistors. Method for measuring combination frequencies
本空白詳細(xì)規(guī)范規(guī)定了制定高低頻放大環(huán)境額定的雙極型晶體管詳細(xì)規(guī)范的基本原則,制定該范圍內(nèi)的所有詳細(xì)規(guī)范應(yīng)與本空白詳細(xì)規(guī)范一致
Semiconductor devices--Discrete devices. Part 7: Bipolar transistors. Section One--Blank detail specification for ambient-rated bipolar transistors for low and high frequency amplification
本標(biāo)準(zhǔn)適用于采用直流法、單脈沖法測(cè)試雙極型晶體管直流參數(shù)的各類多參數(shù)測(cè)試儀,也適用于各類單參數(shù)的直流參數(shù)測(cè)試儀。它是直流參數(shù)測(cè)試儀產(chǎn)品設(shè)計(jì)、、生產(chǎn)和使用的共同技術(shù)依據(jù),也是制訂各種直流參數(shù)測(cè)試儀產(chǎn)品標(biāo)準(zhǔn)的共同技術(shù)依據(jù)
General specification for bipolar transister DC parameter testers
Transistors bipolar. Methods for measuring noise figure at low frequencies
Terminology and letter symbols for insulated-gate bipolar transistor